Analysers for soil testing, analysis and screening

The contamination of soil has gradually been caused by human activity such as industrial processes (e.g. mining, manufacturing), agriculture (use of fertilisers and pesticides), or waste disposal (e.g. improper use of landfill).

Exposure to some of the contaminants such as Pb and Cd is detrimental to human health, and many countries have introduced regulations and programs to identify polluted areas and manage the clean-up process (remediation).

For example, as part of a US waste management program, the U.S EPA introduced Method 6200 for the in-situ determination of 26 key elements in soil and sediment by field portable x-ray fluorescence (XRF) spectrometry.

Operators can follow this method and use handheld XRF analysers such as Oxford Instruments’ X-MET7000 series for the rapid, on-site screening of soil for heavy metals and other pollutants. This enables them to dramatically reduce the number of samples sent to an off-site laboratory for analysis, thus reduces analysis costs and the time it takes to complete the testing program.

By isolating problem areas and defining remediation boundaries on the spot, operators can minimize soil treatment and disposal costs.

  • The X-MET7000 Series benefits:
  • Detection limits down to 1 ppm
  • IP54 rated to withstand the harshest environments and weather condition
  • Large screen with clear, user-defined Pass/Fail messages for fast decision making
  • GPS/GIS integration to combine location data with analysis results for site mapping
  • Meets EPA Method 6200 requirements
XRF soil analysing

Brochure: X-MET7000 series XRF analyser for soil analysis, testing and screening 519.09 KB


    Soil Analysis Expert

    Christelle is our soil analysis expert. If you have any questions or comments about our analysers please ask our experts.