Benchtop XRF for coating thickness and materials analysis

Coating thickness measurement based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering:

  • Simple operation
  • Fast and non-destructive analysis
  • Ability to analyse solids or liquids
  • Cover a wide element range

Benefits
  • High reliability for 24/7 operation
  • Non-destructive analysis of up to 4 layers
  • Measure features as small as 0.05 mm
  • Analyse large parts in the oversized chamber
  • Position large circuit boards with the slot-loading door
  • Automatically analyse multiple samples or points on a single piece with the programmable X-Y stage
  • Export results to spreadsheet and word processing software
Brochure

Brochure: A Range Of Complete Solutions For Coating Thickness Analysis 1.35 MB

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Brochure: Eco Series and MAXXI 5 353.80 KB

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Brochure: MAXXI 6 1.97 MB

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Brochure: X-Strata920 1.31 MB

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    Application Notes

    Application Note: Direct measurement of Phosphorous content in NIP coatings by X-ray Fluorescence 420.11 KB

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    Application Note: Precise Analysis of Gold Alloys 108.42 KB

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    Application Note: Thin Au in ENEPIG coatings 80.43 KB

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      Articles

      Article: The Electroless Nickel Plating Process and Its Importance (Quality Magazine) 127.37 KB

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        Matt K
        Bulk and Coating Thickness Analysers Expert

        Matt K is our Bulk and Coating Thickness Analysers expert.  If you have any questions or comments about products please ask our Experts.

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